KOUTSILIERI, E., Chen, T. E., Kruzik, P., Rausch, W. D., - A morphometric analysis of bipolar and mu

Condition of the lot: Normal (with signs of use)

Autor: KOUTSILIERI, E., Chen, T. E., Kruzik, P., Rausch, W. D.,

Editorial: , Obr., [WES70].. //

Año: 1995

Encuadernación: SC

Idioma: de

Peso: 300

Número: 1


J. Neurosci. Res. 41, 197-205 (1995).
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